A study of electrical properties of Culn (Sex Te1-x )2 thin flims

Abstract

It had been measure the resistivity for Culn (Sex Te1-x )2 thin flims which preparation in vacuum thermal evaporation at thickness (250±25 nm) between (293K) to (423K) for deposited sample and for the sample after annealing in temperature (273K) and (423K) for one hour in vacuum ( 10-6 torr ) . It had been measure the activation energy for these flims before and after annealing .