TY - JOUR ID - TI - Monitoring of Defects Concentration in Deformed Aluminum Using Doppler Broadening Technique مراقبة تراكيز العيوب في الالمنيوم المشوه باستخدام تقانة توسيع دوبلر AU - Ali A. Abdullah علي عطية عبد الله AU - Mazin M. Elias مازن مانوئيل الياس AU - Shafiq s. Shafiq شفيق شاكر شفيق PY - 2004 VL - 1 IS - 1 SP - 149 EP - 153 JO - Baghdad Science Journal مجلة بغداد للعلوم SN - 20788665 24117986 AB - Doppler broadening of the 511 keV positron annihilation ٨٠؛ ا was used to estimate the concentration of defects اة different deformation levels of pure alnminum samples. These samples were compressed at room temperature to 15, 22, 28, 38,40, and 75 % thickness reduction. The two-state ^sitron-trapping model has been employed. 'I he s and w lineshape parameters were measured using high-resolution gamma spectrometer with high pure germanium detector of 2.1 keV resolution at 1.33 MeV of 60Co. The change of defects concentration (Co) with the deformation level (e) is found to obey an empirical formula of the form Cd - A £ B where A and ٥ are positive constants that depend mainly on the deformation procedure and the temperature at which the deformation takes place.

يتضمن البحث استخدام تقانة توسيع دوبلر لخط طاقة فناء البوزترون في تحديد تراكيز العيوب المجهرية ER -