@Article{, title={Structural and Electrical Specification of ZrO2Nano Thin Film Prepared by PLD}, author={Suroor H. Taha and Thamir A. Jumah}, journal={Al-Nahrain Journal of Science مجلة النهرين للعلوم}, volume={24}, number={2}, pages={27-32}, year={2021}, abstract={Zirconium dioxide was prepared as a thin film by using pulse laser deposition (PLD).Subsequently, the films had been thermally treated by annealing process at temperature 450 oC. The structural and electrical parameters of thin films were investigated. As-deposited films were amorphous and had a large surface density of ablated particles. The Annealing process resulted change the phase from amorphous to polycrystalline. The X-ray diffraction of all these films has a polycrystalline structure with two different phases named tetragonal and monoclinic. Hall measurements indicate that the charge carriers of all these films were p-type. In addition, the Hall coefficient suffers some change with thin film thickness. The AC results measured showed the films have resistance and capacitance properties. The AC conduction is dominated by hole cattier.

} }