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The Potential Barrier and Thermal Stability Dependence on PI Thickness of Al/PI/c-Si Schottky Diode
Aseel A. Kareem, Hussein Kh. Rasheed*
Iraqi Journal of Science, 2020, Volume 61, Issue 12, Pages 3235-3241
 

Effect of Thickness on Some Physical Properties of α-Fe2O3 Thin FilmsPrepared by PLD
Muthafar F. Al-Hilli, HaidarJwad Abdul-Ameer Al-Rehamey, Hussein Kh.Rasheed
Iraqi Journal of Science, 2015, Volume 56, Issue 1B, Pages 417-423
 

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