Found: 10 resources
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Effect of Substrate Temperature on Optical and Structural Properties of Indium Oxide Thin Films Prepared by Reactive PLD Method
Engineering and Technology Journal, 2014, Volume 32, Issue 5 Part (A) Engineering, Pages 1323-1330
NANO AND MICRO INDIUM OXIDE STRUCTURE PREPARED USING LASER ABLATION METHOD
Iraqi journal of mechanical and material engineering, 2013, Volume 13, Issue 1, Pages 120-128
Rapid thermal oxidation of copper nanostructure thin film for solar cell fabrication
Iraqi Journal of Physics, 2015, Volume 13, Issue 27, Pages 70-75
Optical and Structural investigations of LiNbO3 thin films by PLD
IRAQI JOURNAL OF COMPUTERS, COMMUNICATIONS, CONTROL AND SYSTEMS ENGINEERING, 2020, Volume 20, Issue 1, Pages 17-23
Morphological and Optical Properties of Cu2O/ 2-D Silicon Photonic Structure for Sensing Applications
IRAQI JOURNAL OF COMPUTERS, COMMUNICATIONS, CONTROL AND SYSTEMS ENGINEERING, 2020, Volume 20, Issue 2, Pages 10-13
The Effect of Mode Area and Refractive Index for Optical TE Mode Propagation in Hybrid LN/Si Electro-Optic Structure of Mach-Zehnder Modulator
IRAQI JOURNAL OF COMPUTERS, COMMUNICATIONS, CONTROL AND SYSTEMS ENGINEERING, 2020, Volume 20, Issue 4, Pages 71-77
Physical Properties of Pure Gold Nanoparticles and Gold Doped ZnO Nanoparticles Using Laser Ablation in Liquid For Sensor Applications
Engineering and Technology Journal, 2022, Volume 40, Issue 2 [Electrical Engineering], Pages 422-427
Structural, Morphological and Optical Properties of Gold Nanoparticles Using Laser Ablation in Liquid for Sensor Applications
IRAQI JOURNAL OF COMPUTERS, COMMUNICATIONS, CONTROL AND SYSTEMS ENGINEERING, 2019, Volume 19, Issue 4, Pages 30-35
Synthesized of GaN Nanostructure Using 1064 nm Laser Wavelength by Pulsed Laser Ablation in Liquid
Engineering and Technology Journal, 2022, Volume 40, Issue 2 [Electrical Engineering], Pages 404-411
The Structural and Optical Investigation of Grown GaN Film on Porous Silicon Substrate Prepared by PLD
Engineering and Technology Journal, 2023, Volume 41, Issue 2 [Electrical Engineering], Pages 270 -279
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