Wideband (0.6-11) micron Angle Deposited Thin Te:S Laser Detector

Abstract

A study of nanostructural, optical and electrical characteristics of obliquely deposited thin sulfur-doped films is presented. The aim was to develop a wideband (0.6-11) micron laser detector operating at room temperature with no need to biasing or amplification. The deposition angle had a decisive role on the detector specifications, namely its detectivity and response time. At deposition angle of 70 deg, the maximum detectivity was achieved 3x10^9 W-1.Hz1/2.cm while at 60 deg a fastest response 1 microsecond was obtained.