A Comparison of Kodak DEF, CX and AX films using soft X-ray wavelengths

Abstract

Kodak direct exposure film (DEF), Kodak industrex films CX and AX have been compared , using a DC X-ray source generating 1.5KeV soft X-rays .Characteristic curves are presented for the three films, also detective quantum efficiency were measured as a function of the incident X-ray flux.The effect of developer temperature on the characteristic curve has been also investigated.