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X-Ray Absorption Fine Structure Spectroscopy of Alumina-Supported Copper Oxide for Conversion Electron Yield Detection

Authors: Rafeef J. Alwan --- Maher F. Mahmood --- Salam R. Khalaf
Journal: Iraqi Journal of Applied Physics المجلة العراقية للفيزياء التطبيقية ISSN: 18132065 23091673 Year: 2018 Volume: 14 Issue: 4 Pages: 29-32
Publisher: iraqi society for alternative and renewable energy sources and techniques الجمعية العراقية لمصادر وتقنيات الطاقة البديلة والمستجدة


In this work, the in-situ x-ray absorption fine structure cell was developed for the conversion electron yield detection to characterize active metal species under reaction gas atmosphere. The probe depth was estimated to be about 9 nm at the Cu K edge. The in-situ conversion electron yield cell was applied to the shape-controlled γ-Al2O3-supported Cu2O catalyst. The reduction to Cu(0) by H2 of octahedral Cu2O particles proceeded at lower temperature than cubic particles, indicating that the surface atomic arrangement affects to the redox reaction of solid particles.

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